Specifications Application notes Documents
Pressure Control Parameters Available Pressure Ranges 0–50 or 0–100 Torr Pressure Control Accuracy ±0.5%F.S. Control Span 1–100% of full scale Response Time ≤1s
Flow Detection Parameters Flow Measurement Range (Ammonia) 0~20/50/100 sccm (please contact us for others) Flow Detection Accuracy 0~25%F.S.: <0.3%F.S.
>25%F.S.: 1%RD
Leak Rate External Leak Rate ≤1×10⁻¹² Pa·m³/s (nitrogen) Internal Leak Rate <0.1 sccm (nitrogen)
Electrical Parameters Power Supply 18~32V (24V recommended) Pressure Signal Output 0~10V Flow Signal Output 0~5V
Communication Interface Communication RS485, EtherCAT, DeviceNet
Mechanical Parameters Connector Type 1/4 VCR Inlet Pressure Range 1.5~3 bar
Environmental Conditions Operating Temperature 15~40℃
Measurement conditions & notes KP300 Series features ultra-compact size, suitable for system integration. Cost-effective solution with high precision and high resolution. Suitable for semiconductor wafer helium cooling system, liquid source pressure control system, MOCVD vapor pressure control. Confirm fluid compatibility, materials, connections, and available configuration with our team before ordering.
Keep the specifications. Request the specification overview by email for your project discussion.
Request specification PDF (English)Need a specific configuration? Tell us your flow range, operating conditions, and interface.
Ask an engineer